Reports of the 34th IUVSTA Workshop

“XPS: From Spectra to Results-Towards an Expert System”

Saint-Malo, France

21-26 April 2002.

 

This page provides links to a summary report of the Workshop and to more
detailed reports for each of the six themes of the Workshop.

 

Theme A: Instrument and Sample Characterization

 

Theme B: Experimental Objectives of an Expert System for XPS

 

Theme C: The Wide or Survey Scan

 

Theme D: Protocols for Narrow Scans, Instrument Setup and Data Acquisition

 

Theme E: Reduction of Narrow Scan Data - Chemical information and Morphology

 

Theme F: Reduction of Narrow Scan Data - Quantification