Reports of the 34th IUVSTA Workshop

“XPS: From Spectra to Results-Towards an Expert System”

Saint-Malo, France

21-26 April 2002.


This page provides links to a summary report of the Workshop and to more
detailed reports for each of the six themes of the Workshop.


Theme A: Instrument and Sample Characterization


Theme B: Experimental Objectives of an Expert System for XPS


Theme C: The Wide or Survey Scan


Theme D: Protocols for Narrow Scans, Instrument Setup and Data Acquisition


Theme E: Reduction of Narrow Scan Data - Chemical information and Morphology


Theme F: Reduction of Narrow Scan Data - Quantification