Reports of the 34th IUVSTA Workshop
“XPS: From Spectra to
Results-Towards an Expert System”
Saint-Malo, France
21-26 April 2002.
This page provides links to a summary
report of the Workshop and to more
detailed reports for each of the six themes of the Workshop.
Theme A: Instrument and Sample Characterization
Theme B: Experimental Objectives of an Expert System for XPS
Theme C: The Wide or Survey Scan
Theme D: Protocols for Narrow Scans, Instrument Setup and Data Acquisition
Theme E: Reduction of Narrow Scan Data - Chemical information and Morphology
