Reports of the 34th IUVSTA Workshop
?XPS: From Spectra to Results-Towards an Expert System?
21-26 April 2002.
This page provides links to a summary
report of the Workshop and to more
detailed reports for each of the six themes of the Workshop.
Theme A: Instrument and Sample Characterization
Theme B: Experimental Objectives of an Expert System for XPS
Theme C: The Wide or Survey Scan
Theme D: Protocols for Narrow Scans, Instrument Setup and Data Acquisition
Theme E: Reduction of Narrow Scan Data - Chemical information and Morphology
Theme F: Reduction of
Narrow Scan Data - Quantification
Theme F: Reduction of Narrow Scan Data - Quantification